New Directions in Mixed Signal Tests


NDIMST - EC-US036

Keywords: mixed signal tests


Start Date: 1 July 93 / Status: finished / Duration: 24 months

[ participants / contact]


Objectivies and Approach

Much of the work in testing has been focused on digital circuits. With the increasing levels of integration, and application such as automative, notebook computers and communication, analogue and digital functions are being integrated on a single chip. The objective of this cooperation therefore is to identify key issues and problems, develop new approached to deriving high quality tests and exchange information and ideas on novel solutions, for mixed analogue and digital signal testing problems in microelectronics.

European links: European partners participate in ESPRIT project ARCHIMEDES (7107), Architectural Methodologies for Advance Testing of VLSI Systems.


Coordinator

Institut National Polytechnique de Grenoble
TIM3
avenue Félix Viallet, 46
F - 38031 GRENOBLE Cedex, F

EU Partners

INPG, F
University of Hannover, D
Université de Montpellier, F

Non-EU Partners

Texas University, USA

CONTACT POINT

Mr. Bernard Courtois
Tel: +33 76 57 46 15
Fax: +33 76 47 38 14
E-mail: courtois@archi.imag.fr


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NDIMST - EC-US036, May 1997


please address enquiries to the ESPRIT Information Desk

html version of synopsis by Nick Cook