Keywords: mixed signal tests
Start Date: 1 July 93 / Status: finished / Duration: 24 months
[ participants / contact]
Much of the work in testing has been focused on digital circuits. With the increasing levels of integration, and application such as automative, notebook computers and communication, analogue and digital functions are being integrated on a single chip. The objective of this cooperation therefore is to identify key issues and problems, develop new approached to deriving high quality tests and exchange information and ideas on novel solutions, for mixed analogue and digital signal testing problems in microelectronics.
European links: European partners participate in ESPRIT project ARCHIMEDES (7107), Architectural Methodologies for Advance Testing of VLSI Systems.
Institut National Polytechnique de Grenoble
TIM3
avenue
Félix Viallet, 46
F - 38031 GRENOBLE Cedex, F
EU Partners
INPG, F
University of Hannover, D
Université de
Montpellier, F
Non-EU Partners
Texas University, USA
Mr. Bernard Courtois
Tel: +33 76 57 46 15
Fax: +33 76 47 38
14
E-mail: courtois@archi.imag.fr
NDIMST - EC-US036, May 1997
please address enquiries to the ESPRIT Information Desk
html version of synopsis by Nick Cook