Functional Test Generation and Diagnosis

FUTEG - CP93-9624

Keywords: functional test generation, VHDL test generation, partial boundary scan, module testing

Start Date: 1 March 1994 / Status: finished / Duration: 36 months

[ participants / contact]

Objectivies and Approach

The objective of this project is to develop a methodology for functional test generation in microelectronics. Testing and diagnosis have great problems in managing the complexity of a system design. One promising way to overcome these problems would involve functional aspects at the system level rather than structural ones at the gate level only. Then it will become possible for system level VHDL descriptions to be the basis for the generation of tests for validation and fault diagnosis.

Three different approaches will be pursued:

European links: ESPRIT Project ATSEC (6575), EEMCN (CP93-7668), ESPRIT Project EUROPRACTICE (21101), TEMPUS JEP 4772, UBISTA (CP94-0391), BENEFIT (CP94-536), HCM Network BELSIGN.

Progress and Results

Investigations are carried out into developing a methodology for automating the test scheduling process, application of artificial intelligence to functional test generation, as well as a test methodology for partial boundary scan and its application to MultiChip module testing.

Information Dissemination Activities and/or Exploitation

Results have been presented in two exhibitions in Jurmala, Latvia, and in Tallinn, 1996. To date, 34 technical reports have been elaborated by the partners. More information can be found at WWW,


Fraunhofer Institut für Integrierte Schaltungen IIS/EAS
Zeunerstrasse 38
D-01069 Dresden, D

EU Partners

Fraunhofer Institut für Integrierte Schaltungen IIS/EAS, D
INPG/TIMA, Grenoble, F

Non-EU Partners

Tallinn Technical University, EE
Kaunas University of Technology, LT
Institute of Computer Systems, Bratislava, SK
Technical University of Budapest, HU


Mr. Bernd Straube
Tel: +49 351 464 07 40
Fax: +49 351 464 07 03

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FUTEG - CP93-9624, May 1997

please address enquiries to the ESPRIT Information Desk

html version of synopsis by Nick Cook