Advanced Research on Test and Evaluation of Mixed-Signal ICs and Systems


ARTEMIS - 6138

Keywords testing, testability, boundary scan testing, built-in self-testing, mixed signal devices


Start Date: 01-JUN-92 / Duration: 36 months

[ contact / participants ]


Objectives

ARTEMIS aims to provide industrially feasible solutions to many current problems in the verification and test of mixed signal designs. The key issues addressed will be the development of dedicated methods for test and design for testability, the improvement of the software infrastructure for verification and test, the exchange of mixed signal test expertise, and the exploitation of results.

The project has four work-packages:

Four exploitation routes are planned:


CONTACT POINT

Mr Eric Van Utteren
NEDERLANDSE PHILIPS BEDRIJVEN BV
Prof. Holstlaan 4
NL - 556 AA EINDHOVEN
tel: + 31/ 40-74 30 77
fax: + 31/ 40-74 46 17
telex: 35000 PHTC NL /NLWESVR

Participants

NEDERLANDSE PHILIPS BEDRIJVEN BV - NL - C
JENOPTIK CARL ZEISS - D - P
MAZET GmbH - D - P

MICROLEX - DK - P
THOMSON-CSF - F - P
INESC - P - A
SGS-THOMSON MICROELECTRONICS SA - F - A
IMEC VZW - B - A


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ARTEMIS - 6138, December 1993


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html version of synopsis by Nick Cook