Advanced Research on Test and Evaluation of Mixed-Signal ICs and Systems

ARTEMIS - 6138

Keywords testing, testability, boundary scan testing, built-in self-testing, mixed signal devices

Start Date: 01-JUN-92 / Duration: 36 months

Objectives

ARTEMIS aims to provide industrially feasible solutions to many current problems in the verification and test of mixed signal designs. The key issues addressed will be the development of dedicated methods for test and design for testability, the improvement of the software infrastructure for verification and test, the exchange of mixed signal test expertise, and the exploitation of results.

The project has four work-packages:

method-oriented activities for IC and board test, such as mixed signal design for testability R&D
solving mixed signal design verification problems via high-level software tools, building on modern DSP-based testers
solving problems in the area of mixed signal production test, addressing computer-aided engineering topics such as fault modelling and correlation tests, as well as topics in the area of automated test equipment, such as interfacing/interconnect
frameworking principles, test specification formats, integration and benchmarking.

Four exploitation routes are planned:

sale of results
internal take-up in the partners' organisations
provision of services to industry (particularly SMEs)
transfer of know-how to a wide range of companies and organisations.

CONTACT POINT

Mr Eric Van Utteren
NEDERLANDSE PHILIPS BEDRIJVEN BV
Prof. Holstlaan 4
NL - 556 AA EINDHOVEN
tel: + 31/ 40-74 30 77
fax: + 31/ 40-74 46 17
telex: 35000 PHTC NL /NLWESVR

Participants

NEDERLANDSE PHILIPS BEDRIJVEN BV - NL - C
JENOPTIK CARL ZEISS - D - P
MAZET GmbH - D - P

MICROLEX - DK - P
THOMSON-CSF - F - P
INESC - P - A
SGS-THOMSON MICROELECTRONICS SA - F - A
IMEC VZW - B - A

ARTEMIS - 6138, December 1993

please address enquiries to the ESPRIT Information Desk

html version of synopsis by Nick Cook